High-resolution Si 2p core-level and low-energy...

High-resolution Si 2p core-level and low-energy electron diffraction studies of the Ca/Si(1 1 1)-(3 × 2) surface

Kazuyuki Sakamoto, Wakaba Takeyama, H.M. Zhang, R.I.G. Uhrberg
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Volume:
532-535
Year:
2003
Language:
english
Pages:
5
DOI:
10.1016/s0039-6028(03)00188-2
File:
PDF, 185 KB
english, 2003
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