Multi-cycle broadside tests with runs of constant primary...

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Multi-cycle broadside tests with runs of constant primary input vectors

Pomeranz, Irith
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Language:
english
Journal:
IET Computers & Digital Techniques
DOI:
10.1049/iet-cdt.2013.0101
Date:
December, 2013
File:
PDF, 167 KB
english, 2013
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