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Kinetics of catastrophic optical damage in GaN-based diode lasers
Hempel, Martin, Tomm, Jens W, Stojetz, Bernhard, König, Harald, Strauss, Uwe, Elsaesser, ThomasVolume:
30
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/30/7/072001
Date:
July, 2015
File:
PDF, 1.59 MB
english, 2015