Exploiting circuit emulation for fast hardness evaluation

IEEE Transactions on Nuclear Science 2001 / Dec. Vol. 48; Iss. 6

Exploiting circuit emulation for fast hardness evaluation

Civera, P., Macchiarulo, L., Rebaudengo, M., Reorda, M.S., Violante, M.
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Volume:
48
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.983197
Date:
January, 2001
File:
PDF, 97 KB
english, 2001
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