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[IEEE 2014 20th International Conference on Ion Implantation Technology (IIT) - Portland, OR, USA (2014.6.26-2014.7.4)] 2014 20th International Conference on Ion Implantation Technology (IIT) - Total ionizing dose effects in high breakdown voltage SOI devices
Zhongjian Wang,, Xinhong Cheng,, Chao Xia,, Dawei Xu,, Lingyan Shen,, Duo Cao,, Li Zheng,, Qian Wang,, Yuehui Yu,Year:
2014
Language:
english
DOI:
10.1109/iit.2014.6940005
File:
PDF, 620 KB
english, 2014