Proton-Radiation Tolerance of Silicon and SU-8 as Structural Materials for High-Reliability MEMS
Bandi, Tobias, Polido-Gomes, Joao, Neels, Antonia, Dommann, Alex, Marchand, Laurent, Shea, Herbert R.Volume:
22
Language:
english
Journal:
Journal of Microelectromechanical Systems
DOI:
10.1109/jmems.2013.2262596
Date:
December, 2013
File:
PDF, 3.66 MB
english, 2013