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Reliability of InAs/GaAs Quantum Dot Lasers Epitaxially Grown on Silicon
Liu, Alan Y., Herrick, Robert W., Ueda, Osamu, Petroff, Pierre M., Gossard, Arthur C., Bowers, John E.Volume:
21
Language:
english
Journal:
IEEE Journal of Selected Topics in Quantum Electronics
DOI:
10.1109/jstqe.2015.2418226
Date:
November, 2015
File:
PDF, 5.50 MB
english, 2015