SPIE Proceedings [SPIE SPIE Sensing Technology + Applications - Baltimore, Maryland, United States (Monday 20 April 2015)] Dimensional Optical Metrology and Inspection for Practical Applications IV - Long wave infrared 3D scanner
Harding, Kevin G., Yoshizawa, Toru, Wiedenmann, Ernst, Afrough, Mohsen, Albert, Sven, Schott, Robert, Tusch, Jan, Wolf, AndreasVolume:
9489
Year:
2015
Language:
english
DOI:
10.1117/12.2076111
File:
PDF, 1.12 MB
english, 2015