![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE MOEMS-MEMS 2007 Micro and Nanofabrication - San Jose, CA (Saturday 20 January 2007)] Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VI - Self-sensing and actuation of CNF and Ni nanowire/polymer composites using electro-micromechanical test
Park, Joung-Man, Kim, Sung-Ju, Kim, Pyung-Gee, Yoon, Dong-Jin, Hansen, George, DeVries, K. Lawrence, Hartzell, Allyson L., Ramesham, RajeshuniVolume:
6463
Year:
2007
Language:
english
DOI:
10.1117/12.703384
File:
PDF, 1.32 MB
english, 2007