![](/img/cover-not-exists.png)
Impacts of Uniaxial Compressive Strain on Dynamic Negative Bias Temperature Instability of p-Channel MOSFETs
Lu, Chia-Yu, Lin, Horng-Chih, Huang, Tiao-YuanVolume:
9
Year:
2006
Language:
english
Journal:
Electrochemical and Solid-State Letters
DOI:
10.1149/1.2173189
File:
PDF, 451 KB
english, 2006