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[ECS 210th ECS Meeting - Cancun, Mexico (October 29-November 3, 2006)] ECS Transactions - Observation of Vacancy in High Purity Silicon Crystal Using Low-Temperature Ultrasonic Measurements
Goto, Terutaka, Yamada-Kaneta, Hiroshi, Saito, Yasuhiro, Nemoto, Yuichi, Sato, Koji, Kakimoto, Koichi, Nakamura, ShintaroVolume:
3
Year:
2006
Language:
english
DOI:
10.1149/1.2355772
File:
PDF, 421 KB
english, 2006