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[ECS 210th ECS Meeting - Cancun, Mexico (October 29-November 3, 2006)] ECS Transactions - Defects Limiting Minorty Carrier Lifetime in 4H-SiC Epilayers
Klein, Paul B., Shanabrook, Benjamin, Huh, Sung Wook, Polyakov, Alexander, Skowronski, Marek, Sumakeris, Joseph, O'Loughlin, MichaelVolume:
3
Year:
2006
Language:
english
DOI:
10.1149/1.2357192
File:
PDF, 467 KB
english, 2006