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[ECS 214th ECS Meeting - Honolulu, HI (October 12 - October 17, 2008)] ECS Transactions - Interfacial Dipole Measurement of Dielectric/Silicon Interface by X-ray Photoelectron Spectroscopy
Kakushima, Kuniyuki, Okamoto, Kouichi, Tachi, Kiichi, Sato, Soushi, Song, Jaeyeol, Kawanago, Takamasa, Ahmet, Parhat, Sugii, Nobuyuki, Tsutsui, Kazuo, Hattori, Takeo, Iwai, H.Year:
2009
Language:
english
DOI:
10.1149/1.3100622
File:
PDF, 319 KB
english, 2009