[ECS 24th Symposium on Microelectronics Technology and Devices - Natal, Brazil (August 31 - September 3, 2009)] ECS Transactions - Influence of Fin Width and Channel Length on the Performance of Buffers Implemented with Standard and Strained Triple-Gate nFinFETs
Pavanello, Marcelo A., Martino, João A., Simoen, Eddy, Rooyackers, Rita, Collaert, Nadine, Claeys, CorYear:
2009
Language:
english
DOI:
10.1149/1.3183765
File:
PDF, 502 KB
english, 2009