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ECS Transactions [ECS 26th Symposium on Microelectronics Technology and Devices (SBMicro 2011) - Joao Pessoa, Brazil (August 30 - September 2, 2011)] - Modeling Electromigration Lifetimes of Copper Interconnects
De Orio, Roberto L., Ceric, Hajdin, Selberherr, SiegfriedYear:
2011
Language:
english
DOI:
10.1149/1.3615190
File:
PDF, 1.08 MB
english, 2011