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Room-Temperature Voltage Stressing Effects on Resistive Switching of Conductive-Bridging RAM Cells with Cu-Doped SiO2 Films
Lin, Jian-Yang, Wang, Bing-XunVolume:
2014
Year:
2014
Language:
english
Journal:
Advances in Materials Science and Engineering
DOI:
10.1155/2014/594516
File:
PDF, 904 KB
english, 2014