TFT-LCD Mura defects automatic inspection system using...

ARCHIVE Proceedings of the Institution of Mechanical Engineers Part B Journal of Engineering Manufacture 1989-1996 (vols 203-210) 2008 / 11 Vol. 222; Iss. 11

TFT-LCD Mura defects automatic inspection system using linear regression diagnostic model

Chen, S-L, Chang, J-H
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Volume:
222
Language:
english
Journal:
Proceedings of the Institution of Mechanical Engineers, Part B: Journal of Engineering Manufacture
DOI:
10.1243/09544054jem1067
Date:
November, 2008
File:
PDF, 1.10 MB
english, 2008
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