Atomkraft-Mikroskopie zur Vermessung von mikrooptischen...

Atomkraft-Mikroskopie zur Vermessung von mikrooptischen Komponenten

Haselbeck, Stefan, Schwider, Johannes
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Volume:
63
Language:
german
Journal:
tm - Technisches Messen
DOI:
10.1524/teme.1996.63.jg.191
Date:
January, 1996
File:
PDF, 919 KB
german, 1996
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