Processing, basic characterization and standard dielectric...

Processing, basic characterization and standard dielectric measurements on PLZT x /65/35 (4 ≤ x ≤ 11) ceramics

Pytel, Krzysztof, Suchanicz, Jan, Livinsh, Maris, Sternberg, Andris
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Volume:
87
Language:
english
Journal:
Phase Transitions
DOI:
10.1080/01411594.2014.953520
Date:
November, 2014
File:
PDF, 761 KB
english, 2014
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