Optical diagnostic suite (schlieren, interferometry, and grid image refractometry) on OMEGA EP using a 10-ps, 263-nm probe beam
Froula, D. H., Boni, R., Bedzyk, M., Craxton, R. S., Ehrne, F., Ivancic, S., Jungquist, R., Shoup, M. J., Theobald, W., Weiner, D., Kugland, N. L., Rushford, M. C.Volume:
83
Year:
2012
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.4733739
File:
PDF, 443 KB
english, 2012