Effect of SiO2 and SiO2/SiNx Passivation on the Stability...

IEEE Transactions on Electron Devices 2015 / 3 Vol. 62; Iss. 3

Effect of SiO2 and SiO2/SiNx Passivation on the Stability of Amorphous Indium-Gallium Zinc-Oxide Thin-Film Transistors Under High Humidity

Chowdhury, Md Delwar Hossain, Mativenga, Mallory, Um, Jae Gwang, Mruthyunjaya, Ravi K., Heiler, Gregory N., Tredwell, Timothy John, Jang, Jin
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Volume:
62
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2015.2392763
Date:
March, 2015
File:
PDF, 2.83 MB
english, 2015
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