(Invited) Dielectric Damage
Shohet, J. L., Lin, Q., King, S. W., Ren, H., Banna, S., Jakes, J. E., Agasie, R. J., Naik, M., Nishi, Y., Nichols, M. T., Mavrakakis, K., Hsu, K., Guo, X., Pei, D., Li, W., Choudhury, F., Zheng, H.Volume:
60
Language:
english
Journal:
ECS Transactions
DOI:
10.1149/06001.0733ecst
Date:
February, 2014
File:
PDF, 270 KB
english, 2014