Study of the Resistive Switching Effect in Chromium Oxide Thin Films by Use of Conductive Atomic Force Microscopy
Pham, Kim Ngoc, Choi, Minsu, Tran, Cao Vinh, Do Nguyen, Trung, Van Hieu Le,, Choi, Taekjib, Lee, Jaichan, Phan, Bach ThangVolume:
44
Language:
english
Journal:
Journal of Electronic Materials
DOI:
10.1007/s11664-015-3889-z
Date:
October, 2015
File:
PDF, 1.45 MB
english, 2015