![](/img/cover-not-exists.png)
Capacitance–conductance characteristics of Au/Ti/Al 2 O 3 / n -GaAs structures with very thin Al 2 O 3 interfacial layer
Turut, A, Karabulut, A, Ejderha, K, Bıyıklı, NVolume:
2
Language:
english
Journal:
Materials Research Express
DOI:
10.1088/2053-1591/2/4/046301
Date:
March, 2015
File:
PDF, 1.00 MB
english, 2015