[IEEE IECON 2014 - 40th Annual Conference of the IEEE Industrial Electronics Society - Dallas, TX, USA (2014.10.29-2014.11.1)] IECON 2014 - 40th Annual Conference of the IEEE Industrial Electronics Society - Study of failure mechanism in the modern IGBT with a highly doped N-buffer layer
Zhu, Chunlin, Deviny, Ian, Liu, Gary, Dai, AndyYear:
2014
Language:
english
DOI:
10.1109/iecon.2014.7048751
File:
PDF, 1.27 MB
english, 2014