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[IEEE 2015 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2015.4.19-2015.4.23)] 2015 IEEE International Reliability Physics Symposium - Instabilities of SiC MOSFETs during use conditions and following bias temperature stress
Pobegen, Gregor, Krassnig, AndreasYear:
2015
Language:
english
DOI:
10.1109/irps.2015.7112771
File:
PDF, 196 KB
english, 2015