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[IEEE 2015 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2015.4.19-2015.4.23)] 2015 IEEE International Reliability Physics Symposium - NBTI and HCD aware behavioral models for reliability analysis of analog CMOS circuits
Heidmann, Nils, Hellwege, Nico, Paul, Steffen, Peters-Drolshagen, DagmarYear:
2015
Language:
english
DOI:
10.1109/irps.2015.7112779
File:
PDF, 307 KB
english, 2015