SoC yield optimization via an embedded-memory test and...

IEEE Design & Test of Computers 2004 / 05 Vol. 21; Iss. 3

SoC yield optimization via an embedded-memory test and repair infrastructure

Shoukourian, S., Vardanian, V., Zorian, Y.
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Volume:
21
Language:
english
Journal:
IEEE Design and Test of Computers
DOI:
10.1109/mdt.2004.19
Date:
May, 2004
File:
PDF, 138 KB
english, 2004
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