Proton-Induced Degradation of InP/InGaAs HBTs Predicted by...

IEEE Transactions on Nuclear Science 2015 / 6 Vol. 62; Iss. 3

Proton-Induced Degradation of InP/InGaAs HBTs Predicted by Nonionizing Energy Loss Model

Li, C. H., Lu, H. L., Zhang, Y. M., Liu, M., Zhao, X. H.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
62
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2015.2416729
Date:
June, 2015
File:
PDF, 948 KB
english, 2015
Conversion to is in progress
Conversion to is failed