Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
2015 / 05 Vol. 33; Iss. 3
Filamentary bipolar electric pulse induced resistance switching in amorphous silicon resistive random access memory
Ebrahim, Rabi, Mithun Kumar, Ramasahayam, Badi, Nacer, Wu, Naijuan, Ignatiev, AlexVolume:
33
Language:
english
Journal:
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
DOI:
10.1116/1.4919087
Date:
May, 2015
File:
PDF, 3.98 MB
english, 2015