Local structure study of (In0.95−xFexCu0.05)2O3 thin films using x-ray absorption spectroscopy
Ren, Yuan, Xing, Yaya, Ma, Guanxiong, Zhao, Xingliang, Wang, Shiqi, An, Yukai, Liu, JiwenVolume:
33
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.4922643
Date:
July, 2015
File:
PDF, 996 KB
english, 2015