SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Monday 23 May 2011)] Optical Measurement Systems for Industrial Inspection VII - Stokes holography for recording and reconstructing objects using polarization fringes
Singh, Rakesh Kumar, Naik, Dinesh N., Itou, Hitoshi, Miyamoto, Yoko, Takeda, Mitsuo, Lehmann, Peter H., Osten, Wolfgang, Gastinger, KayVolume:
8082
Year:
2011
Language:
english
DOI:
10.1117/12.888963
File:
PDF, 899 KB
english, 2011