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SPIE Proceedings [SPIE SPIE Solar Energy + Technology - San Diego, California, USA (Sunday 12 August 2012)] Reliability of Photovoltaic Cells, Modules, Components, and Systems V - Examination of a size-change test for photovoltaic encapsulation materials
Miller, David C., Gu, Xiaohong, Ji, Liang, Kelly, George, Nickel, Nichole, Norum, Paul, Shioda, Tsuyoshi, Tamizhmani, Govindasamy, Wohlgemuth, John H., Dhere, Neelkanth G., Wohlgemuth, John H.Volume:
8472
Year:
2012
Language:
english
DOI:
10.1117/12.929796
File:
PDF, 1.00 MB
english, 2012