![](/img/cover-not-exists.png)
Modeling Pattern Density Dependent Bump Formation in Copper Electrochemical Deposition
Im, Yeon Ho, Bloomfield, Max O., Sen, Suchira, Cale, Timothy S.Volume:
6
Year:
2003
Language:
english
Journal:
Electrochemical and Solid-State Letters
DOI:
10.1149/1.1541256
File:
PDF, 756 KB
english, 2003