[ECS 215th ECS Meeting - San Francisco, CA (May 24 - May 29, 2009)] ECS Transactions - Performance, Reliability, Radiation Effects, and Aging Issues in Microelectronics - From Atomic-Scale Physics to Engineering-Level Modeling
Pantelides, Sokrates T., Tsetseris, Leonidas, Beck, Matthew J., Rashkeev, Sergey N., Hadjisavvas, George, Batyrev, Iskander, Tuttle, Blair, Marinopoulos, Apostolos G., Zhou, Xing, Fleetwood, Daniel M.Year:
2009
Language:
english
DOI:
10.1149/1.3122099
File:
PDF, 1.22 MB
english, 2009