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ECS Transactions [ECS China Semiconductor Technology International Conference 2010 (CSTIC 2010) - Shanghai, China (March 18 - March 19, 2010)] - Effect of Oxidation Enhanced Diffusion on Hot Carrier Injection Induced Degradation in N-Type High-Voltage DDDMOSFET
Deng, ZhangPeng, Li, Xi, Zhang, Rui H., Yun, Yueyun, Huang, Aibo, Cao, Gang, Shi, YanlingYear:
2010
Language:
english
DOI:
10.1149/1.3360628
File:
PDF, 689 KB
english, 2010