![](/img/cover-not-exists.png)
Interaction of Point Defects with Impurities in the Si-SiO2 System and its Influence on the Interface Properties
Kropman, Daniel, Mellikov, Enn, Kärner, Tiit, Heinmaa, Ivo, Laas, Tõnu, Londos, Charalampos A., Misiuk, AndrzejVolume:
178-179
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/ssp.178-179.263
Date:
August, 2011
File:
PDF, 284 KB
english, 2011