Beam Injection Methods as Tools for Studying Extended...

Solid State Phenomena 1996 Vol. 51-52

Beam Injection Methods as Tools for Studying Extended Defects in Semiconductors: Characteristics and Capabilities

Castaldini, Antonio, Cavallini, Anna
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Volume:
51-52
Year:
1996
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/ssp.51-52.51
File:
PDF, 878 KB
english, 1996
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