Impact of Defects on the Leakage Currents of Si/SiGe/Si...

Solid State Phenomena 2004 Vol. 95-96

Impact of Defects on the Leakage Currents of Si/SiGe/Si Heterojunction Bipolar Transistors

Wolansky, D., Fischer, G.G., Knoll, D., Bolze, D., Tillack, Bernd, Schley, P., Yamamoto, Y.
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Volume:
95-96
Year:
2004
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/ssp.95-96.249
File:
PDF, 999 KB
english, 2004
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