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Low-cost assessment of wheat resistance to yellow rust through conventional RGB images
Zhou, B., Elazab, A., Bort, J., Vergara, O., Serret, M.D., Araus, J.L.Volume:
116
Language:
english
Journal:
Computers and Electronics in Agriculture
DOI:
10.1016/j.compag.2015.05.017
Date:
August, 2015
File:
PDF, 3.31 MB
english, 2015