Wideband measurement system for on-chip ESD waveform characterisation
Colman, G., Bauwelinck, J., Gillon, R., Wieers, A., Vandewege, J.Volume:
48
Year:
2012
Language:
english
Journal:
Electronics Letters
DOI:
10.1049/el.2011.3841
File:
PDF, 155 KB
english, 2012