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The MAXEBIS at GSI as a test ion source for charge breeding and for HITRAP
Kester, O., Becker, R., Pfister, J., Sokolov, A., Vorobjev, G., Vogel, M., Winters, D., Zimmermann, H.Volume:
79
Year:
2008
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.2823900
File:
PDF, 672 KB
english, 2008