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Regression testing in an industrial environment
Onoma, Akira K., Tsai, Wei-Tek, Poonawala, Mustafa, Suganuma, HiroshiVolume:
41
Language:
english
Journal:
Communications of the ACM
DOI:
10.1145/274946.274960
Date:
May, 1998
File:
PDF, 583 KB
english, 1998