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Permanent magnet electron beam ion source/trap systems with bakeable magnets for improved operation conditionsa)
Schmidt, M., Zschornack, G., Kentsch, U., Ritter, E.Volume:
85
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.4828723
Date:
February, 2014
File:
PDF, 635 KB
english, 2014