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Development of wavelength-dispersive soft X-ray emission spectrometers for transmission electron microscopes--an introduction of valence electron spectroscopy for transmission electron microscopy
Terauchi, M., Koike, M., Fukushima, K., Kimura, A.Volume:
59
Language:
english
Journal:
Journal of Electron Microscopy
DOI:
10.1093/jmicro/dfq010
Date:
August, 2010
File:
PDF, 540 KB
english, 2010