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Nitrogen doping and multiplicity of stacking faults in SiC
Pirouz, P., Zhang, M., Hobgood, H. McD., Lancin, M., Douin, J., Pichaud, B.Volume:
86
Language:
english
Journal:
Philosophical Magazine
DOI:
10.1080/14786430600724470
Date:
October, 2006
File:
PDF, 502 KB
english, 2006