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In situ SEM electromechanical characterization of nanowire using an electrostatic tensile device
Zeng, Hongjiang, Li, Tie, Bartenwerfer, Malte, Fatikow, Sergej, Wang, YuelinVolume:
46
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/46/30/305501
Date:
July, 2013
File:
PDF, 2.26 MB
english, 2013