X-ray diffraction strain analysis of a single axial InAs...

X-ray diffraction strain analysis of a single axial InAs 1– x P x nanowire segment

Keplinger, Mario, Mandl, Bernhard, Kriegner, Dominik, Holý, Václav, Samuelsson, Lars, Bauer, Günther, Deppert, Knut, Stangl, Julian
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Volume:
22
Language:
english
Journal:
Journal of Synchrotron Radiation
DOI:
10.1107/s160057751402284x
Date:
January, 2015
File:
PDF, 1018 KB
english, 2015
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