Two-Stage Degradation of p-Type Polycrystalline Silicon...

IEEE Transactions on Electron Devices 2014 / 11 Vol. 61; Iss. 11

Two-Stage Degradation of p-Type Polycrystalline Silicon Thin-Film Transistors Under Dynamic Positive Bias Temperature Stress

Zhang, Dongli, Wang, Mingxiang, Lu, Xiaowei
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Volume:
61
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2014.2359299
Date:
November, 2014
File:
PDF, 1.45 MB
english, 2014
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