Conduction Mechanisms of Leakage Currents in InGaN/GaN-Based Light-Emitting Diodes
Han, Dong-Pyo, Oh, Chan-Hyoung, Kim, Hyunsung, Shim, Jong-In, Kim, Kyu-Sang, Shin, Dong-SooVolume:
62
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2014.2381218
Date:
February, 2015
File:
PDF, 1.44 MB
english, 2015